René Kothe, Heinrich Theodor Vierhaus. Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures. In Sebastián López, editor, 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, DSD 2010, 1-3 September 2010, Lille, France. pages 283-290, IEEE, 2010. [doi]
Abstract is missing.