Introduction of advanced testing procedures including PHIL for DG providing ancillary services

Panos Kotsampopoulos, Nikos D. Hatziargyriou, Benoit Bletterie, Georg Lauss, Thomas I. Strasser. Introduction of advanced testing procedures including PHIL for DG providing ancillary services. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 5398-5404, IEEE, 2013. [doi]

Abstract

Abstract is missing.