Estimation of Storage Life of Electronic Components Based on Degradation Analysis

A. Ya. Koulibaba, A. Yu. Shtukarev, A. A. Sashoy, O. V. Yushin. Estimation of Storage Life of Electronic Components Based on Degradation Analysis. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-4, IEEE, 2018. [doi]

Abstract

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