The following publications are possibly variants of this publication:
- Determination of bulk discharge current in the dielectric film of MEMS capacitive switchesM. Koutsoureli, G. J. Papaioannou. mr, 51(9-11):1874-1877, 2011. [doi]
- Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switchesMatroni Koutsoureli, N. Siannas, George J. Papaioannou. mr, 76:631-634, 2017. [doi]
- 3 dielectric films for MEMS capacitive switchesD. Birmpiliotis, Matroni Koutsoureli, J. Kohylas, George J. Papaioannou, A. Ziaei. mr, 88:840-845, 2018. [doi]