Integrated circuits' characterization for non-normal data in semiconductor quality analysis

Ingrid Kovacs, Marina Topa, Andi Buzo, Georg Pelz. Integrated circuits' characterization for non-normal data in semiconductor quality analysis. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-2, IEEE, 2017. [doi]

Abstract

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