Emma Kowalczuk, Arnab Bhattacharya, Ka Chung Lee, Jesse Alton, Martin Igarashi, Stephane Barbeau. Fault localisation of defects using Electro Optical Terahertz Pulse Reflectometry and 3D EM modelling with Virtual Known Good Device. In 2014 International 3D Systems Integration Conference, 3DIC 2014, Kinsdale, Ireland, December 1-3, 2014. pages 1-4, IEEE, 2014. [doi]
Abstract is missing.