Jutta Kreyß, Steve Selvaggio, Michael White, Zach Zakharian. Text Mining for a Clear Picture of Defect Reports: A Praxis Report. In Proceedings of the 3rd IEEE International Conference on Data Mining (ICDM 2003), 19-22 December 2003, Melbourne, Florida, USA. pages 727-730, IEEE Computer Society, 2003. [doi]
@inproceedings{KreyssSWZ03,
title = {Text Mining for a Clear Picture of Defect Reports: A Praxis Report},
author = {Jutta Kreyß and Steve Selvaggio and Michael White and Zach Zakharian},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/icdm/2003/1978/00/19780727abs.htm},
researchr = {https://researchr.org/publication/KreyssSWZ03},
cites = {0},
citedby = {0},
pages = {727-730},
booktitle = {Proceedings of the 3rd IEEE International Conference on Data Mining (ICDM 2003), 19-22 December 2003, Melbourne, Florida, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1978-4},
}