Block-level bayesian diagnosis of analogue electronic circuits

Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff. Block-level bayesian diagnosis of analogue electronic circuits. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1767-1772, IEEE, 2010. [doi]

Abstract

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