Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses

Shaji Krishnan, Hans G. Kerkhoff. Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. IEEE Design & Test of Computers, 30(3):18-24, 2013. [doi]

Abstract

Abstract is missing.