Advanced Atomic Force Microscope based System for Manipulating at the Nanoscale

Florian Krohs, Michael Weigel-Jech, Uwe Mick, M. Isken, Sergej Fatikow. Advanced Atomic Force Microscope based System for Manipulating at the Nanoscale. In Hideki Hashimoto, Haruhisa Kawasaki, editors, 9th IFAC Symposium on Robot Control, SyRoCo 2009, Gifu, Japan, September 9-12, 2009. Volume 42 of IFAC Proceedings Volumes, pages 615-620, International Federation of Automatic Control, 2009. [doi]

Abstract

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