Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects

Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng. Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects. IEEE Trans. on CAD of Integrated Circuits and Systems, 20(3):416-425, 2001. [doi]

Abstract

Abstract is missing.