A unified model for timing speculation: Evaluating the impact of technology scaling, CMOS design style, and fault recovery mechanism

Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaralingam. A unified model for timing speculation: Evaluating the impact of technology scaling, CMOS design style, and fault recovery mechanism. In Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010, Chicago, IL, USA, June 28 - July 1 2010. pages 487-496, IEEE, 2010. [doi]

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