Bram Kruseman, Stefan van den Oetelaar. Detection of Resistive Shorts in Deep Sub-micron Technologies. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 866-875, IEEE Computer Society, 2003. [doi]
Abstract is missing.