Methodology of automation process of wafer tests

Aleksandra Krzyzanowska, Piotr Maj, Pawel Grybos, Robert Szczygiel, Anna Koziol. Methodology of automation process of wafer tests. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 530-533, IEEE, 2015. [doi]

Abstract

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