Aleksandra Krzyzanowska, Piotr Maj, Pawel Grybos, Robert Szczygiel, Anna Koziol. Methodology of automation process of wafer tests. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 530-533, IEEE, 2015. [doi]
Abstract is missing.