Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Thomas Fröhnel, Sudesh Saroop, Sani R. Nassif, Kevin J. Nowka. The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM. IEEE Trans. on Circuits and Systems, 58-I(9):2010-2016, 2011. [doi]
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