Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gaelli, Koenraad Van Leemput. JExample: Exploiting Dependencies between Tests to Improve Defect Localization. In Pekka Abrahamsson, Richard Baskerville, Kieran Conboy, Brian Fitzgerald, Lorraine Morgan, Xiaofeng Wang, editors, Agile Processes in Software Engineering and Extreme Programming, 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Volume 9 of Lecture Notes in Business Information Processing, pages 73-82, Springer, 2008. [doi]
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