Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults

Malay Kule, Hafizur Rahaman 0001, Bhargab B. Bhattacharya. Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults. Journal of Circuits, Systems, and Computers, 28(11):1950180, 2019. [doi]

Abstract

Abstract is missing.