Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment. IEEE Trans. VLSI Syst., 23(7):1185-1195, 2015. [doi]

Abstract

Abstract is missing.