Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 266-271, IEEE Computer Society, 2005. [doi]
Abstract is missing.