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Efficient Error-Detection and Recovery Mechanisms for Reliability and Resiliency of Multicores

Sandip Kundu, Omer Khan. Efficient Error-Detection and Recovery Mechanisms for Reliability and Resiliency of Multicores. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 12-13, IEEE Computer Society, 2016. [doi]

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