Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay. Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 307-312, IEEE Computer Society, 2009. [doi]
Abstract is missing.