A Metric for Test Set Characterization and Customization Toward Fault Diagnosis

Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(11):1824-1828, 2013. [doi]

Abstract

Abstract is missing.