Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa. Classification method for defect images based on association and clustering. In Belur V. Dasarathy, editor, Data Mining and Knowledge Discovery: Theory, Tools, and Technology V, Orlando, FL, USA, April 21, 2003. Volume 5098 of SPIE Proceedings, pages 19-27, SPIE, 2003. [doi]
Abstract is missing.