Yield Ramp up by Scan Chain Diagnosis

Feng-Ming Kuo, Yuan-Shih Chen. Yield Ramp up by Scan Chain Diagnosis. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 94-95, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.