Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei. Jitter Models and Measurement Methods for High-Speed Serial Interconnects. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1295-1302, IEEE, 2004. [doi]
Abstract is missing.