Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor

Keisuke Kuroiwa, Masaki Kadowaki, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki. Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor. IEICE Transactions, 95-C(3):355-359, 2012. [doi]

Authors

Keisuke Kuroiwa

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Masaki Kadowaki

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Masataka Moriya

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Hiroshi Shimada

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Yoshinao Mizugaki

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