Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor

Keisuke Kuroiwa, Masaki Kadowaki, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki. Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor. IEICE Transactions, 95-C(3):355-359, 2012. [doi]

@article{KuroiwaKMSM12,
  title = {Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor},
  author = {Keisuke Kuroiwa and Masaki Kadowaki and Masataka Moriya and Hiroshi Shimada and Yoshinao Mizugaki},
  year = {2012},
  url = {http://search.ieice.org/bin/summary.php?id=e95-c_3_355},
  researchr = {https://researchr.org/publication/KuroiwaKMSM12},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {95-C},
  number = {3},
  pages = {355-359},
}