Volkan Kursun, Eby G. Friedman. Node Voltage Dependent Subthreshold Leakage Current Characteristics of Dynamic Circuits. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 104-109, IEEE Computer Society, 2004. [doi]
Abstract is missing.