The Optimal Feature Extraction Procedure for Statistical Pattern Recognition

Marek Kurzynski, Edward Puchala. The Optimal Feature Extraction Procedure for Statistical Pattern Recognition. In Marina L. Gavrilova, Osvaldo Gervasi, Vipin Kumar, Chih Jeng Kenneth Tan, David Taniar, Antonio Laganà, Youngsong Mun, Hyunseung Choo, editors, Computational Science and Its Applications - ICCSA 2006, International Conference, Glasgow, UK, May 8-11, 2006, Proceedings, Part III. Volume 3982 of Lecture Notes in Computer Science, pages 1210-1215, Springer, 2006. [doi]

Abstract

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