Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy

Y. Kuwabara, S. Nishimura, R. Zaharuddin, J. Shirakashi. Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy. In 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011. pages 681-684, IEEE, 2011. [doi]

Abstract

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