Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity

Soonhak Kwon, Chang Hoon Kim, Chun-Pyo Hong. Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity. In Helena Handschuh, M. Anwar Hasan, editors, Selected Areas in Cryptography, 11th International Workshop, SAC 2004, Waterloo, Canada, August 9-10, 2004, Revised Selected Papers. Volume 3357 of Lecture Notes in Computer Science, pages 144-158, Springer, 2004. [doi]

Abstract

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