X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs

Ya-Chun Lai, Shi-Yu Huang. X-Calibration: A Technique for Combating Excessive Bitline Leakage Current in Nanometer SRAM Designs. J. Solid-State Circuits, 43(9):1964-1971, 2008. [doi]

Abstract

Abstract is missing.