Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks

Y. T. K. Lai, J. S. Hu, Y. H. Tsai, W. Y. Chiu. Industrial Anomaly Detection and One-class Classification using Generative Adversarial Networks. In 2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018, Auckland, New Zealand, July 9-12, 2018. pages 1444-1449, IEEE, 2018. [doi]

Abstract

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