Feature extraction and damage-precursors for prognostication of lead-free electronics

Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee. Feature extraction and damage-precursors for prognostication of lead-free electronics. Microelectronics Reliability, 47(12):1907-1920, 2007. [doi]

Abstract

Abstract is missing.