A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices

Bernd Laquai. A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 764-772, IEEE, 2004. [doi]

Abstract

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