Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip

Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng. Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 385-392, IEEE Computer Society, 2003. [doi]

Abstract

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