Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin. IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2055-2058, IEEE, 2011. [doi]
Abstract is missing.