Mark S. K. Lau, Keck Voon Ling, Yun-Chung Chu, Arun Bhanu. A general mathematical model of probabilistic ripple-carry adders. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1100-1105, IEEE, 2010. [doi]
Abstract is missing.