Thomas Laurent 0003, Stephen Gaffney, Anthony Ventresque. Re-visiting the coupling between mutants and real faults with Defects4J 2.0. In 15th IEEE International Conference on Software Testing, Verification and Validation Workshops ICST Workshops 2022, Valencia, Spain, April 4-13, 2022. pages 189-198, IEEE, 2022. [doi]
Abstract is missing.