Georg Lauss, Felix Lehfuss, Benoit Bletterie, Thomas I. Strasser, Roland Bründlinger. Examination of LV grid phenomena by means of PHIL testing. In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012. pages 4771-4776, IEEE, 2012. [doi]
Abstract is missing.