Bao Le, Dipanjan Sengupta, Andreas G. Veneris, Zissis Poulos. Accelerating post silicon debug of deep electrical faults. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 61-66, IEEE, 2013. [doi]
Abstract is missing.