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A Runaway Process Control Mechanism

Chung-Chieh Lee. A Runaway Process Control Mechanism. In Leo F. Zimmerman, John P. Pilch, Linda J. Carroll, Mark Sorkin, Daniel Kaberon, Doug McBride, Frank M. Bereznay, Dale Doolittle, Joel Goldstein, Dave Thorn, Harry Zimmer, Ellen E. Robertson, Peggy De Rossett, Bernard Domanski, Philip Clark, Robert L. Morrison, Edgar A. Ortiz, editors, 17th International Computer Measurement Group Conference, Nashville, TN, USA, December 9-13, 1991, Proceedings. pages 612-619, Computer Measurement Group, 1991.

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