Reducing Test Application Time and Power Dissipation for Scan-Based Testing via Multiple Clock Disabling - researchr publication

researchr

You are not signed in
Sign in
Sign up

Kuen-Jong Lee, Jih-Jeen Chen. Reducing Test Application Time and Power Dissipation for Scan-Based Testing via Multiple Clock Disabling. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 338, IEEE Computer Society, 2002. [doi]

Abstract is missing.

runs on WebDSL