A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction

Sangjun Lee, Kyunghwan Cho, Sungki Choi, Sungho Kang. A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction. IEEE Trans. on Circuits and Systems, 67-II(12):3432-3436, 2020. [doi]

Abstract

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