Cheng-Yen Lee, Tzu-ping Huang, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai. A High Current efficiency Stacked Digital Low Dropout Array with True-Random-Noise Injection and Ultralow Output Ripple for Power-Side Channel Attack Protection. In 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019. pages 322, IEEE, 2019. [doi]
@inproceedings{LeeHCLLT19,
title = {A High Current efficiency Stacked Digital Low Dropout Array with True-Random-Noise Injection and Ultralow Output Ripple for Power-Side Channel Attack Protection},
author = {Cheng-Yen Lee and Tzu-ping Huang and Ke-Horng Chen and Ying-Hsi Lin and Shian-Ru Lin and Tsung-Yen Tsai},
year = {2019},
doi = {10.23919/VLSIC.2019.8778069},
url = {https://doi.org/10.23919/VLSIC.2019.8778069},
researchr = {https://researchr.org/publication/LeeHCLLT19},
cites = {0},
citedby = {0},
pages = {322},
booktitle = {2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019},
publisher = {IEEE},
isbn = {978-4-86348-720-8},
}