Impact of fin thickness and height on read stability / write ability in tri-gate FinFET based SRAM

Junha Lee, Hanwool Jeong, Younghwi Yang, Jisu Kim, Seong-Ook Jung. Impact of fin thickness and height on read stability / write ability in tri-gate FinFET based SRAM. In International SoC Design Conference, ISOCC 2012, Jeju Island, South Korea, November 4-7, 2012. pages 479-482, IEEE, 2012. [doi]

Abstract

Abstract is missing.