Sangick Lee, Seokwoo Kang, Taewon Kim, Seungsoo Lee, Mabae Kim. Improving the Performance of Serial Arc Detection using VMD and Deep Neural Network. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 614-617, IEEE, 2019. [doi]
Abstract is missing.