Ho-Young Lee, Tae-Hwan Oh, Ho-Jin Park, Hae-Seung Lee, Mark Spaeth, Jae-Whui Kim. 2 Pipelined ADC with On-Chip Digital Self-Calibration. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 313-316, IEEE, 2007. [doi]
Abstract is missing.