Sheen-Mok Lee, Ji-Ae Shin. Definition and Extraction of Causal Relations for QA on Fault Diagnosis of Devices. In 20th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2008), November 3-5, 2008, Dayton, Ohio, USA, Volume 2. pages 82-85, IEEE Computer Society, 2008. [doi]
Abstract is missing.