JinKyu Lee, Nur A. Touba. Low Power BIST Based on Scan Partitioning. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 33-41, IEEE Computer Society, 2005. [doi]
Abstract is missing.